Silicon carbide (SiC) has arrived, and it’s a big deal. It was written all over APEC 2023 show with a string attached: the cost of a SiC device is significantly higher than its silicon counterpart.

You would think that if you worked as a track inspector for a railroad company, reporting defects would make you good at your job. After all, wouldn't the company want to know where its trains should ...

When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...