This article is the second in a series from PDF Solutions on why adopting big data platforms will transform the compound semiconductor industry. The first part “Accelerating silicon carbide (SiC) ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

Production delays and quality errors are a universal challenge in manufacturing. In Aerospace and defense (A&D), however, the stakes are especially high. An equipment failure or out-of-tolerance ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

As electric vehicles surge onto our roads and portable devices dominate our daily lives, lithium-ion batteries have become the invisible powerhouses of modern technology. Yet beneath their sleek ...