Changing market forces are making design-for-testability tools a more critical part of the savvy design engineer’s toolset Design for testability (DFT) is not a new concept. But the reasons why ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...