Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...

FLANDERS, N.J.--(BUSINESS WIRE)--Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, ...

April 15, 2013. Rudolph Technologies Inc., a provider of process characterization equipment and software for the semiconductor and related industries, announced that it has sold an NSX Series macro ...

Rudolph Technologies has announced the first shipment of its all-surface macro-defect detection system to a US-based manufacturer of flash memories. The system, which will be installed in a ...

Rudolph Technologies, Inc. RTEC, a leader in the design, development, manufacture and support of defect inspection, lithography, metrology, and process control software used by semiconductor and ...

MILPITAS, Calif.--(BUSINESS WIRE)--Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of solutions for advanced process control, today announced the acquisition of Nanda Technologies, GmbH ...