X-ray microanalysis is an analytical technique that provides immense possibilities to extend beyond high resolution mapping of elements. Speed and precision are the real powers of X-ray microanalysis, ...

Within analytical sciences, energy dispersive X-ray spectroscopy (otherwise known as EDS) and CL in the scanning electron microscope (termed SEM) are vital microanalysis techniques. During the process ...

Christopher J. Kiely, the Harold B. Chambers Senior Professor of Materials Science and Engineering at Lehigh University’s P.C. Rossin College of Engineering and Applied Science, has been elected as a ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

At the Microscopy & Microanalysis 2008 Annual Meeting opening, Bruker AXS Microanalysis has introduced several new products and options for Scanning Electron Microscope (SEM) based materials analysis.

Lehigh University materials science and engineering (MSE) professor Masashi Watanabe is the 2023 recipient of the Microanalysis Society Presidential Science Award, which recognizes a senior scientist ...

On April 11th JoVE (Journal of Visualized Experiments) will publish a new video article by Dr. Aydogan Ozcan demonstrating how a cell phone camera can capture images from a fluorescent microscope and ...

Enhancements to the Noran System Six, Thermo Electron's X-ray microanalysis system, enable productivity gains in high-throughput microstructure characterization. Combined with a newly introduced 30-mm ...

The Nature Index tracks primary research articles from 145 natural-science and health-science journals, chosen based on reputation by an independent group of researchers. The Nature Index provides ...

Bruker AXS Inc. has announced the closing of two complementary acquisitions in the $150 million per annum X-ray microanalysis market. Applications of microanalysis include nanotechnology and advanced ...

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