As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable ...
Richardson, Texas—A product called DFT Analyzer from ASSET InterTech, Inc., a maker of IEEE-1149.1/JTAG boundary-scan test and ISP (in-system programming) tools, promises to reduce manufacturing and ...
Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
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