EDN

Spring contact probe

The Eccentric plunger probe employs a patented biasing design that improves the reliability and longevity of the probe by reducing resistance and probe wear. By drilling the plunger’s spring cavity in ...
Electronic Design

Test Clips Employ Spring Probe Design

Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the ...
EDN

Probe card is designed for wafer-level packages

Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...
Electronic Design

ECT reports ZIP spring probe wins head-to-head competition

Fontana, CA. Everett Charles Technologies (ECT) announced it has won a head-to-head evaluation using ZIP Z0-040 probes made with HyperCore material in a high-volume production environment at a large ...