Fast Atom Diffraction (FAD) and surface scattering techniques have emerged as pivotal methods for probing the atomic-scale architecture of material surfaces. This approach leverages the quantum ...

MIT.nano has added a new X-ray diffraction (XRD) instrument to its characterization toolset, enhancing facility users' ability to analyze materials at ...

Antiferromagnetic (AF) crystals like NiO are experiencing a renaissance as promising materials for ultrafast spintronics. To re-establish old experimental results of surface property investigations ...

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