EDN

Socket targets hi-/lo-temp test of 18-lead flex devices

The SBT-FLEX-7000 zero-insertion-force socket addresses high-performance requirements for testing 0.5-mm-pitch, 18-position-linear-array flex devices at temperatures ranging from −55°C to 180°C. The ...
Semiconductor Engineering

Enhancing Test Socket Performance Through Application-Specific Validation And System-Level Per-Pin OQC

As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater. Yet, traditional socket design validation methods—such as per-pin ...
EDN

Test Sockets Highlighted at Wescon

Aries Electronics chose Wescon (Santa Clara, CA, April 12-14, www.wescon.com) to highlight a new test and burn-in socket as well as a new RF socket. The company's new test and burn-in socket ...
Electronic Design

Test Sockets Handle Frequencies Up To 23 GHz

The pogo-pin based ET 2300 socket system operates at frequencies up to 23 GHz with an insertion loss of -1 dB. It allows users to test and debug any BGA, QFN, or other custom packages with lead ...
Electronic Design

Test Socket Handles Many Package Types

Test and burn-in of integrated circuits can be performed by a new socket that accommodates packages from 41 mm2 to 55 mm2. This covers ICs such as SRAMs, DRAMs, DSPs and flash memories. Packages that ...
Semiconductor Engineering

Coaxial Test Sockets Are In The Critical Path Of Advanced AI/CPU Products

Advanced AI/CPU processors demand extreme high frequency and power performance from SLT and ATE test sockets. These sockets are in the critical path at the end of a very costly silicon fabrication and ...